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上殿明良

Uedono, Akira

数理物質系 , 教授
Institute of Pure and Applied Sciences , Professor

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81. Er³⁺ induced point defects in ZnO and impact of Li⁺/Na⁺/K⁺ on the vacancy defects in ZnO:Er studied by positron annihilation spectroscopy Sellaiyan, S.; Uedono, A.; Devi, L.V.; Sivaji, K.
Applied Physics A: Materials Science and Processing 125: 497 (2019) Semantic Scholar
82. Vacancy-type defects in GaN self-assembled nanowires probed using monoenergetic positron beam Uedono, A.; Siladie, A.-M.; Pernot, J.; Daudin, B.Ishibashi, S.
Journal of Applied Physics 125: (2019) Semantic Scholar
83. Free volumes introduced by fractures of CFRP probed using positron annihilation Uedono, A.; Sako, K.; Ueno, W.; Kimura, M.
Composites Part A: Applied Science and Manufacturing 122: 54 (2019) Semantic Scholar
84. Simple way of finding Ba to Si deposition rate ratios for high photoresponsivity in BaSi2 films by Raman spectroscopy Yamashita, Y.; Takahara, Y.; Sato, T.; Toko, K. (+1 著者) Suemasu, T.
Applied Physics Express 12: (2019) Semantic Scholar
85. Effect of dopant concentration and annealing of Yttrium doped CuO nanocrystallites studied by positron annihilation spectroscopy Sellaiyan, S.; Vimala Devi, L.; Sako, K.; Uedono, A.Sivaji, K.
Journal of Alloys and Compounds 788: 549 (2019) Semantic Scholar
86. Structural disorder and in-gap states of Mg-implanted GaN films evaluated by photothermal deflection spectroscopy Sumiya, M.; Fukuda, K.; Takashima, S.; Ueda, S. (+3 著者) Uedono, A.
Journal of Crystal Growth 511: 15 (2019) Semantic Scholar
87. Characterization of the distribution of defects introduced by plasma exposure in Si substrate Sato, Y.; Shibata, S.; Uedono, A.; Urabe, K.Eriguchi, K.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films 37: (2019) Semantic Scholar
88. Two-dimensional mapping of hydrogen and other elements in materials with microbeam-based transmission ERDA and PIXE Yamazaki, A.; Naramoto, H.; Sasa, K.; Ishii, S. (+4 著者) Uedono, A.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 450: 319 (2019) Semantic Scholar
89. 筑波大学タンデム加速器施設UTTAC の現状（2017 年度）笹公和; 石井聡; 大島弘行; 高橋努 (+5 著者) 上殿明良
第31回タンデム加速器及びその周辺技術の研究会報告集 21 (2018)
90. Positron Annihilation Studies on Chemically Synthesized FeCo Alloy P. Rajesh; S. Sellaiyan; A. Uedono; T. ArunR. Justin Joseyphus
Scientific Reports 8: 9764 (2018) Semantic Scholar
91. Fast Optical Characterization of Microvoid Size in Hydrogenated Amorphous Silicon: Study on the Universal Applicability of the Correlation between the Microvoid Size and the Optical Constant Nobuyuki Matsuki; Takuya Matsui; Koji Michishio; Brian E. O'Rourke (+1 著者) Akira Uedono
AM-FPD 2018 - 25th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings (2018) Semantic Scholar
92. Large electron capture-cross-section of the major nonradiative recombination centers in Mg-doped GaN epilayers grown on a GaN substrate S. F. Chichibu; K. Shima; K. Kojima; S. Takashima (+3 著者) A. Uedono
Applied Physics Letters 112: (2018) Semantic Scholar
93. Annealing behavior of open spaces in AlON films studied by monoenergetic positron beams Akira Uedono; Takahiro Yamada; Takuji Hosoi; Werner Egger (+3 著者) Heiji Watanabe
Applied Physics Letters 112: (2018) Semantic Scholar
94. Polarity-dependence of the defect formation in c -axis oriented ZnO by the irradiation of an 8 MeV proton beam Kazuto Koike; Mitsuaki Yano; Shun-Ichi Gonda; Akira Uedono (+2 著者) Shigefusa F. Chichibu
Journal of Applied Physics 123: (2018) Semantic Scholar
95. The origins and properties of intrinsic nonradiative recombination centers in wide bandgap GaN and AlGaN S. F. Chichibu; A. Uedono; K. Kojima; H. Ikeda (+4 著者) S. Ishibashi
Journal of Applied Physics 123: (2018) Semantic Scholar
96. Vacancy-type defects in Al2O3/GaN structure probed by monoenergetic positron beams Akira Uedono; Toshihide Nabatame; Werner Egger; Tönjes Koschine (+3 著者) Shoji Ishibashi
Journal of Applied Physics 123: (2018) Semantic Scholar
97. Carrier Trapping by Vacancy-Type Defects in Mg-Implanted GaN Studied Using Monoenergetic Positron Beams Akira Uedono; Shinya Takashima; Masaharu Edo; Katsunori Ueno (+7 著者) Shoji Ishibashi
Physica Status Solidi (B) Basic Research 255: (2018) Semantic Scholar
98. Synthesis and characterization of titanium silicon oxide thin films prepared by plasma enhanced atomic layer deposition Iwashita, S.; Moriya, T.; Uedono, A.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films 36: (2018) Semantic Scholar
99. Room-temperature photoluminescence lifetime for the near-band-edge emission of (000 1 ) p-type GaN fabricated by sequential ion-implantation of Mg and H Shima, K.; Iguchi, H.; Narita, T.; Kataoka, K. (+2 著者) Chichibu, S.F.
Applied Physics Letters 113: (2018) Semantic Scholar
100. Ion energy control and its applicability to plasma enhanced atomic layer deposition for synthesizing titanium dioxide films Shinya Iwashita; Kazuki Denpoh; Munehito Kagaya; Takamichi Kikuchi (+3 著者) Akira Uedono
Thin Solid Films 660: 865 (2018) Semantic Scholar

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1. 12TH INTERNATIONAL WORKSHOP ON SLOW POSITRON BEAM TECNIQUES (SLOPOS12) Uedono, A; Ishibashi, S; Oshima, N; Ohdaira, T; Suzuki, R (担当:分担執筆, 範囲:Application of positron annihilation technique to front and backend processes for modern LSI devices)
IOP PUBLISHING LTD 2011年1月
2. GALLIUM NITRIDE MATERIALS AND DEVICES VI Uedono, Akira; Ishibashi, Shoji; Chichibu; Shigefusa F; Akimoto, Katsuhiro (担当:分担執筆, 範囲:Point defects in GaN and related group-III nitrides studied by means of positron annihilation)
SPIE-INT SOC OPTICAL ENGINEERING 2011年1月 (ISBN: 9780819484765)
3. PROCEEDINGS OF THE 2009 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE Uedono, A; Inoue, N; Hayashi, Y; Eguchi, K; Nakamura, T; Hirose, Y; Yoshimaru, M; Oshima, N; Ohdaira, T; Suzuki, R (担当:分担執筆, 範囲:Characterization of Low-k SiOCH Layers in Fine-Pitch Cu-Damascene Interconnects by Monoenergetic Positron Beams)
IEEE 2009年1月 (ISBN: 9781424444915)
4. Physica Status Solidi C - Current Topics in Solid State Physics, Vol 4, No 10 Uedono, A; Naito, T; Otsuka, T; Ito, K; Shiraishi, K; Yamabe, K; Miyazaki, S; Watanabe, H; Umezawa, N; Hamid, A; Chikyow, T; Ohdaira, T; Suzuki, R; Ishibashi, S; Inumiya, S; Kamiyama, S; Akasaka, Y; Nara, Y; Yamada, K (担当:分担執筆, 範囲:Study of high-k gate dielectrics by means of positron annihilation)
WILEY-V C H VERLAG GMBH 2007年1月
5. Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, Vols 1 and 2 Shimizu, Yukiko; Miyashita, Naoya; Mura, Yusuke; Uedono, Akira; Okada, Yoshitaka (担当:分担執筆, 範囲:Optimization of growth of GaInNAs dilute nitrides for multi-junction solar cell applications)
IEEE 2006年1月 (ISBN: 1424400163)
6. COMPOUND SEMICONDUCTORS 2004, PROCEEDINGS Shimizu, Y; Kobayashi, N; Uedono, A; Okada, Y (担当:分担執筆, 範囲:Defect control in Ga(In)NAs films grown by atomic H assisted R-F-MBE)
IOP PUBLISHING LTD 2005年1月
7. FUNDAMENTALS OF NOVEL OXIDE/SEMICONDUCTOR INTERFACES Uedono, A; Mitsuhashi, R; Horiuchi, A; Torii, K; Yamabe, K; Yamada, K; Suzuki, R; Ohdaira, T; Mikado, T (担当:分担執筆, 範囲:Point defects in thin HfAIO(x) films probed by monoenergetic positron beams)
MATERIALS RESEARCH SOCIETY 2004年1月 (ISBN: 1558997245)
8. POSITRON ANNIHILATION, ICPA-13, PROCEEDINGS Uedono, A; Kiyohara, M; Shimoyama, K; Matsunaga, Y; Yasui, N; Yamabe, K (担当:分担執筆, 範囲:Vacancy-type defects in SrTiO3 probed by a monoenergetic positron beam)
TRANS TECH PUBLICATIONS LTD 2004年1月

1. Electrical properties of silicon-implanted alpha-Al2O3 Okumura, Hironori; Jinno, Riena; UEdono, Akira; Imura, Masataka
The 4th International Workshop on Gallium Oxide and Related Materials 2022年10月23日
2. Origin and dynamic properties of major intrinsic nonradiative recombination centers in wide bandgap nitride semiconductors Chichibu; Shigefusa F; Shima, Kohei; Kojima, Kazunobu; Ishibashi, Shoji; Uedono, Akira
Conference on Gallium Nitride Materials and Devices XV 2020年2月4日
3. Control of vacancy-type defects in Mg implanted GaN studied by positron annihilation spectroscopy Uedono, Akira; Dickmann, Marcel; Egger, Werner; Hugenschmidt, Christoph; Ishibashi, Shoji; Chichibu; Shigefusa F
Conference on Gallium Nitride Materials and Devices XV 2020年2月4日
4. Annealing Behaviours of Open Spaces in Thin Al2O3 Films Deposited on Semiconductors Studied Using Monoenergetic Positron Beams Uedono, A; Egger, W; Koschine, T; Hugenschmidt, C; Dickmann, M; Ishibashi, S
15th International Workshop on Slow Positron Beam Techniques and Applications (SLOPOS) 2019年9月2日
5. Calculation of Positron States and Annihilation Parameters in Gamma and Amorphous Al2O3 Ishibashi, S; Uedono, A
15th International Workshop on Slow Positron Beam Techniques and Applications (SLOPOS) 2019年9月2日
6. Photoluminescence Studies of Sequentially Mg and H Ion-implanted GaN with Various Implantation Depths and Crystallographic Planes Shima, Kohei; Kojima, Kazunobu; Uedono, Akira; Chichibu; Shigefusa F
19th International Workshop on Junction Technologies (IWJT) 2019年6月6日
7. Defect Identification in Bonding Surface Layers by Positron Annihilation Spectroscopy Inoue, Fumihiro; Peng, Lan; Iacovo, Serena; Nagano, Fuya; Sleeckx, Erik; Beyer, Gerald; Uedono, Akira; Beyne, Eric
6th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) 2019年5月21日
8. Vacancy-type defects in GaN-based power device structure - defect characterization in ion implanted GaN and Al2O3/GaN - Uedono, Akira; Egger, Werner; Hugenschmidt, Christoph; Ishibashi, Shoji
Compound Semiconductor Week (CSW) Conference 2019年5月19日
9. Room temperature photoluminescence lifetime for the near-band-edge emission of epitaxial and ion-implanted GaN on GaN structures Chichibu; Shigefusa F; Shima, Kohei; Kojima, Kazunobu; Takashima, Shin-ya; Ueno, Katsunori; Edo, Masaharu; Iguchi, Hiroko; Narita, Tetsuo; Kataoka, Keita; Ishibashi, Shoji; Uedono, Akira
International Workshop on Bulk Nitride Semiconductors (IWN) 2018年11月11日
10. 陽電子消滅によるCIGS薄膜中の空孔型欠陥の検出 Akira, Uedono; Islam, Muhammad Monirul; Sakurai, Takeaki; katsuhiro, Akimoto
2018年第79応用物理学会秋季学術講演会 2018年9月18日
11. Structural disorder and in-gap states of Mg-implanted GaN films evaluated by photothermal deflection spectroscopy Sumiya, M; Fukuda, K; Takashima, S; Ueda, S; Onuma, T; Yamaguchi, T; Honda, T; Uedono, A
19th International Conference on Metalorganic Vapor Phase Epitaxy (ICMOVPE) 2018年6月3日
12. Ion energy control and its applicability to plasma enhanced atomic layer deposition for synthesizing titanium dioxide films Iwashita, Shinya; Denpoh, Kazuki; Kagaya, Munehito; Kikuchi, Takamichi; Noro, Naotaka; Hasegawa, Toshio; Moriya, Tsuyoshi; Uedono, Akira
International Thin Films Conference (TACT) 2017年10月15日
13. Two-dimensional mapping of hydrogen and other elements in materials with microbeam-based transmission ERDA and PIXE Yamazaki, A; Naramoto, H; Sasa, K; Ishii, S; Tomita, S; Sataka, M; Kudo, H; Ohkubo, M; Uedono, A
23rd International Conference on Ion Beam Analysis (IBA) 2017年10月8日
14. AIN metal-semiconductor field-effect transistors using Si-ion implantation Okumura, Hironori; Suihkonen, Sami; Lemettinen, Jori; Uedono, Akira; Zhang, Yuhao; Piedra, Daniel; Palacios, Tomas
International Conference on Solid State Devices and Materials (SSDM) 2017年9月19日
15. The origins and properties of intrinsic nonradiative recombination centers in wide bandgap GaN and AlGaN Chichibu, S. F; Uedono, A; Kojima, K; Ikeda, H; Fujito, K; Takashima, S; Edo, M; Ueno, K; Ishibashi, S
29th International Conference on Defects in Semiconductors (ICDS) 2017年7月31日
16. Polarity-dependence of the defect formation in c-axis oriented ZnO by the irradiation of an 8 MeV proton beam Koike, Kazuto; Yano, Mitsuaki; Gonda, Shun-ichi; Uedono, Akira; Ishibashi, Shoji; Kojima, Kazunobu; Chichibu; Shigefusa F
29th International Conference on Defects in Semiconductors (ICDS) 2017年7月31日
17. 筑波大学タンデム加速器施設UTTACの現状（2016年度）森口, 哲朗; 石井聡; 大島弘行; 高橋努; 田島義一; 大和良広; 関場大一郎; 笹公和; 上殿明良
第30回タンデム加速器及びその周辺技術の研究会 2017年7月6日
18. Carrier Trapping by Vacancy-Type Defects in Mg-Implanted GaN Studied Using Monoenergetic Positron Beams Uedono, Akira; Takashima, Shinya; Edo, Masaharu; Ueno, Katsunori; Matsuyama, Hideaki; Egger, Werner; Koschine, Toenjes; Hugenschmidt, Christoph; Dickmann, Marcel; Kojima, Kazunobu; Chichibu; Shigefusa F; Ishibashi, Shoji
12th International Conference on Optics of Surfaces and Interfaces (OSI) 2017年6月25日
19. Point defects in GaN and related group-III nitrides studied by means of positron annihilation Uedono, Akira; Ishibashi, Shoji; Chichibu; Shigefusa F; Akimoto, Katsuhiro
Conference on Gallium Nitride Materials and Devices VI 2011年1月24日
20. Point defects in GaN and related group-III nitrides studied by means of positron annihilation Uedono, Akira; Ishibashi, Shoji; Chichibu; Shigefusa F; Akimoto, Katsuhiro
Conference on Gallium Nitride Materials and Devices VI 2011年1月24日